A new high-sensitivity X-ray diffraction technique for determining local deformations of a crystal surface using “bending interference fringes”-Reference-Cited by-同舟云学术

A new high-sensitivity X-ray diffraction technique for determining local deformations of a crystal surface using “bending interference fringes”

Published:2016-09 Issue:9 Volume:42 Page:955-958
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Suvorov E. V.,Smirnova I. A.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063785016090261.pdf

Reference12 articles.

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3. P. V. Petrashen’, F. N. Chukhovskii, I. L. Shul’pina, and R. N. Kyutt, Sov. Phys. Solid State 29 (5), 927 (1987).

4. F. N. Chukhovskii and P. V. Petrashen’, Acta Cryst. A 44, 8 (1988).

5. T. Fukamachi, M. Tohyama, et al., Acta Cryst. A 66, 421 (2010).

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