X-Ray Topography Characterization of the Bridgman-Grown Crystals of Zinc Germanium Phosphide-Reference-Cited by-同舟云学术

X-Ray Topography Characterization of the Bridgman-Grown Crystals of Zinc Germanium Phosphide

Published:2018-09-23 Issue:11 Volume:53 Page:1800154
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Crystal Research and Technology

Author:

Kaloyan Alexander A.¹,Podurets Konstantin M.¹^ORCID,Prokhorov Igor A.²,Kovalenko Ekaterina S.¹,Bezbakh Ilya Zh.²,Okunev Aleksey O.³,Gribenyukov Alexander I.⁴⁵,Verozubova Galina A.⁴

Affiliation:

1. National Research Centre “Kurchatov Institute,”; Moscow 123182 Russia

2. Shubnikov Institute of Crystallography; Federal Scientific Research Centre “Crystallography and Photonics,”; Russian Academy of Sciences; Moscow 119333 Russia

3. Institute of Electronic and Information Systems; Yaroslav-the-Wise Novgorod State University; Veliky Novgorod 173003 Russia

4. Institute of Monitoring of Climatic and Ecological Systems; Siberian Branch of Russian Academy of Sciences; Tomsk 634055 Russia

5. Radiophysics Faculty; Tomsk State University; Tomsk 634050 Russia

Funder

Ministry of Education and Science of the Russian Federation

Federal Agency of Scientific Organizations

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/crat.201800154/fullpdf