1. Goor, A.J., Testing Semiconductor Memories, Theory and Practice, Chichester: Wiley, 1991.
2. Georgiev, N.V. and Orlov, B.V., Functional Control of the Semiconductor Memory Devices, Elektronnaya Promyshlennost’, 1980, no. 6, pp. 3–21.
3. Karpovsky, M.G. and Yarmolik, V.N., Transparent Memory Testing for Pattern Sensitive Faults, IEEE Int. Test Conf., 1994, pp. 860–869.
4. Mazumder, P. and Chakraborty, K., Testing and Testable Design of High-Density Random-Access Memories, Boston: Kluwer, 1996.
5. Zankovich, A.P. and Yarmolik, V.N., Nondestructive RAM Test Based on the Analysis of the Output Data Symmetry, Avtom. Telemekh., 2003, no. 9, pp. 141–154.