Evaluation of multibit upsets in integrated circuits under heavy charged particles-Reference-Cited by-同舟云学术

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Evaluation of multibit upsets in integrated circuits under heavy charged particles

Published:2014-03 Issue:2 Volume:43 Page:91-95
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Chumakov A. I.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063739714020048.pdf

Reference6 articles.

1. Radiation Effects in Embedded Systems, Velazco, R., Fouillat, P., and Reis, R., Eds., Dordrech: Springer, 2007.

2. Soft Errors in Modern Electronic Systems, Nicolaidis, M., Ed., New York: Springer, 2011.

3. Chumakov, A.I., Deistvie kosmicheskoi radiatsii na IS (Effect of Cosmic Radiation on ICs), Moscow: Radio i svyaz’, 2004.

4. Messenger, G.C. and Ash, M.S., Single Event Phenomena, New York: Chapman & Hall, 1997.

5. Tylka, A.J., et al., CREME96: a revision of the cosmic ray effects on microelectronic code, IEEE Trans. Nucl. Sci., 1997, vol. 44, no. 6, pp. 2150–2160.

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