1. Adell, P.C., Schrimpf, R.D., Choi, B.K., Holman, W.T., Attwood, J.P., Cirba, C.R., and Galloway, K.F., Totaldose and single-event effects in switching DC/DC power converters, IEEE Trans. Nucl. Sci., 2002, vol. 49, no. 6, pp. 3217–3221.
2. Adell, P.C., Schrimpf, R.D., Holman, W.T., Boch, J., Stacey, J., Ribero, P., Sternberg, A., and Galloway, K.F., Total-dose and single-event effects in DC/DC converter control circuitry, IEEE Trans. Nucl. Sci., 2003, vol. 50, no. 6, pp. 1867–1872.
3. Skorobogatov, P.K., Nikiforov, A.Y., Mavritsky, O.B., Egorov, A.N., and Kirgizova, A.V., Influence of temperature on pulsed laser SEE testing, in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems (Noordwijk, 2003), Noordwijk: ESA Publ. Division, 2004, pp. 153–155.
4. Chumakov, A.I., Pechenkin, A.A., Savchenkov, D.V., Tararaksin, A.S., Vasil’ev, A.L., and Yanenko, A.V., Local laser irradiation technique for SEE testing of ICs, in 12th European Conference on Radiation and Its Effects on Components and Systems, Sevilla, 2011, pp. 449–453.
5. Kessarinskii, L.N., Methods and tools for predicting and enhancing the resistance of pulse voltage stabilizers to the influence of radiation factors of outer space, Cand. Sci. (Eng.) Dissertation, Moscow: National Research Nuclear Univ. MEPhI, 2012.