Total-dose and single-event effects in DC/DC converter control circuitry-Reference-Cited by-同舟云学术

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Total-dose and single-event effects in DC/DC converter control circuitry

Published:2003-12 Issue:6 Volume:50 Page:1867-1872
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Adell P.C.¹,Schrimpf R.D.¹,Holman W.T.¹,Boch J.¹,Stacey J.¹,Ribero P.¹,Sternberg A.¹,Galloway K.F.¹

Affiliation:

1. Radiat. Effects & Reliability Group, Vanderbilt Univ., Nashville, TN, USA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/28269/01263813.pdf?arnumber=1263813

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A High-Reliability Redundancy Scheme for Design of Radiation-Tolerant Half-Duty Limited DC-DC Converters;Electronics;2021-05-12

2. A radiation-hardened Buck converter;IEICE Electronics Express;2019

3. Experimental research of heavy ion and proton induced single event effects for a Bi-CMOS technology DC/DC converter;Journal of Semiconductors;2015-11

4. Electric regime influence on the DC-DC converters’s hardness to single event transients;Russian Microelectronics;2015-01

5. Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter;Journal of Electronic Testing;2012-11-16

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