Anomalous photoconductivity decay observed in microwave measurements of carrier lifetime in silicon ingots-Reference-Cited by-同舟云学术

Anomalous photoconductivity decay observed in microwave measurements of carrier lifetime in silicon ingots

Published:2006-12 Issue:6 Volume:35 Page:345-349
ISSN:1063-7397
Container-title:Russian Microelectronics
language:en
Short-container-title:Russ Microelectron

Author:

Borodovskii P. A.,Buldygin A. F.,Tokarev A. S.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063739706060011.pdf

Reference5 articles.

1. Borodovskii, P.A., Buldygin, A.F., and Tokarev, A.S., Fiz. Tekh. Poluprovodn. (St. Petersburg), 2004, vol. 38,issue 9, p. 1043 [Semiconductors (Engl. Transl.), vol. 38, no. 9, p. 1005].

2. Borodovskii, P.A., Buldygin, A.F., Tokarev, A.S., and Chernyavskii, E.V., Mikroelektronika, 2005, vol. 34, no. 5, p. 375 [Russ. Microelectron. (Engl. Transl.), vol. 34, no. 5, p. 316].

3. Jacobs, H., Brand, F.A., Meindl, J.D., Weitz, S., Benjamin, R., and Holmes, D.A., Proc. IEEE, 1963, vol. 51, no. 4, p. 581.

4. Zubov, B.V., Manenkov, A.A., Milyaev, V.A., Mikhailova, G.N., Murina, T.M., Sanina, V.A., and Seferov, A.S., in Tr. FIAN, 1977, vol. 100, p. 51.

5. Lichtenstein, R.M. and Willard, H.J., Jr., Rev. Sci. Instrum., 1967, vol. 38, no. 1, p. 133.

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