X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals-Reference-Cited by-同舟云学术

X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals

Published:2011-02 Issue:1 Volume:5 Page:155-158
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Drmeyan H. R.,Aboyan A. H.,Eyramjyan F. H.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S102745101102008X.pdf

Reference9 articles.

1. U. Bonse, M. Hart, and G. H. Schuttke, Phys. Status Solidi 33, 361 (1969).

2. G. H. Schuttke and K. Brack, Z. Naturforsch., A: Phys. Sci. 28f, 654 (1973).

3. L. Gerward, Z. Phys. 259, 313 (1973).

4. A. O. Aboyan, Izv. NAN Armenii, Fiz. 35, 212 (2000).

5. Electron Microscopy of Thin Crystals, Ed. by P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan (Plenum Press, New York, 1965; Mir, Moscow, 1968).

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