Morphological transformations of vanadium oxide films during low-temperature reduction in hydrogen electron cyclotron resonance plasma-Reference-Cited by-同舟云学术

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Morphological transformations of vanadium oxide films during low-temperature reduction in hydrogen electron cyclotron resonance plasma

Published:2007-08 Issue:4 Volume:1 Page:454-461
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Aliev V. Sh.,Votentsev V. N.,Gutakovskii A. K.,Maroshina S. M.,Shcheglov D. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451007040167.pdf

Reference11 articles.

1. C. C. Hale, J. S. Orr, L. T. Traub, and K. L. Lewis, Proc. SPIE 1270, 22 (1990).

2. M. Varasi, C. Misiano, and L. Lasaponara, Electronics and Optics 105, 164 (1984).

3. E. Barrette and J. Christopher, USA Patent Application 200100035341. A1 (November 1, 2001).

4. K. Kosuge, J. Phys. Chem. Solids 28, 1613 (1967).

5. W. Hideo, N. Mitsuhiro, O. Naoki, et al., US Patent 5.801.383 (1998).

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