X-ray diagnostics of semiconductor heterostructures: Some achievements and perspectives for development-Reference-Cited by-同舟云学术

X-ray diagnostics of semiconductor heterostructures: Some achievements and perspectives for development

Published:2010-02 Issue:1 Volume:4 Page:104-121
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Imamov R. M.,Subbotin I. A.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

Reference26 articles.

1. Zh. I. Alferov, Fiz. Tekh. Poluprovodn. 32(1), 3 (1998) [Semiconductors 32, 1 (1998)].

2. G. B. Galiev, I. S. Vasil’evskii, E. A. Klimov, et al., Zh. Tekh. Fiz. 77(4), 50 (2007) [Tech. Phys. 52, 440 (2007)].

3. I. A. Subbotin, M. A. Chuev, E. M. Pashaev, R. M. Imamov, et al., Kristallografiya 52, 638 (2007) [Crystallogr. Rep. 52, 611 (2007)].

4. I. S. Vasil’evskii, G. B. Galiev, E. A. Klimov, et al., Fiz. Tekh. Poluprovodn. 42, 1102 (2008) [Semiconductors 42, 1084 (2008)].

5. R. M. Imamov, I. A. Subbotin, and G. B. Galiev, Kristallografiya 53, 210 (2008) [Crystallogr. Rep. 53, 183 (2008)].

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献