Determination of the thickness of a gold layer deposited onto silicon via reflected electron spectroscopy-Reference-Cited by-同舟云学术

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Determination of the thickness of a gold layer deposited onto silicon via reflected electron spectroscopy

Published:2013-01 Issue:1 Volume:7 Page:123-129
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Afanas’ev V. P.,Kaplya P. S.,Kostanovskiy I. A.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451012080046.pdf

Reference9 articles.

1. A. P. Tikhonov and V. Ya. Arsenin, Methods of Solving Incorrect Problems (Nauka, Moscow, 1980), p. 288 [in Russian].

2. R. C. Wicks and N. J. C. Ingle, Rev. Sci. Instrum. 80, 053108 (2009).

3. L. D. Landau and E. M. Lifshitz, Collection of Works (Nauka, Moscow, 1969), Vol. 1, pp. 482–490 [in Russian].

4. S. Goudsmit and J. L. Saunderson, Phys. Rev. 58, 36 (1940).

5. V. P. Pronin and I. M. Bronshtein, Sov. Phys. Solid State 17, 1363 (1976).

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