Expanding the Analytical Capabilities of Scanning Electron Microscopy in the Detection of Backscattered Electrons
Author:
Publisher
Pleiades Publishing Ltd
Subject
Instrumentation
Link
https://link.springer.com/content/pdf/10.1134/S0020441223040097.pdf
Reference27 articles.
1. Reimer, L., Scanning Electron Microscopy. Physics of Image Formation and Microanalysis, Berlin: Springer, 1998.
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3. Guritagaitia, A., Rosenkranz, R., Löffler, M., Clausner, A., Standke, Y., and Zschech, E., Ultramicroscopy, 2018, vol. 195, p. 47. https://doi.org/10.1016/j.ultramic.2018.08.026
4. Müller, E. and Gerthsen, D., Ultramicroscopy, 2017, vol. 173, p. 71. https://doi.org/10.1016/j.ultramic.2016.12.003
5. Sánchez, E., Torres Deluigi, M., and Castellano, G., Microsc. Microanal., 2012, vol. 18, p. 1355. https://doi.org/10.1017/S1431927612013566
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