X-ray Photoelectron Spectroscopy Study of Indium Tin Mixed Oxides on the Surface of Silicate Glass-Reference-Cited by-同舟云学术

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X-ray Photoelectron Spectroscopy Study of Indium Tin Mixed Oxides on the Surface of Silicate Glass

Published:2020-05 Issue:5 Volume:56 Page:482-493
ISSN:0020-1685
Container-title:Inorganic Materials
language:en
Short-container-title:Inorg Mater

Author:

Teterin Yu. A.,Maslakov K. I.,Murav’ev E. N.,Teterin A. Yu.,Bulychev N. A.,Meshkov B. B.,Stepnov D. S.

Publisher

Pleiades Publishing Ltd

Subject

Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering

Link

https://link.springer.com/content/pdf/10.1134/S0020168520050131.pdf

Reference24 articles.

1. Konstruktsionnaya optika (Structural Optics), Solinov, V.F., Ed., Moscow: AB-Inter, 2017.

2. Barr, T.L. and Liu, Y.L., An X-ray photoelectron spectroscopy study of the valence band structure of indium oxides, J. Phys. Chem. Solids, 1989, vol. 50, no. 7, pp. 657–664.

3. Anwar, M., Ghauri, I.M., and Siddiqi, S.A., An XPS study of amorphous thin films of mixed oxides In2O3–SnO2 system deposited by co-evaporation, Int. J. Mod. Phys. B, 2007, vol. 21, no. 7, pp. 1027–1042.

4. Lin, A.W.C., Armstrong, N.R., and Kuwana, T., X-ray photoelectron/Auger electron spectroscopic studies of tin and indium metal foils and oxides, Anal. Chem., 1977, vol. 49, no. 8, pp. 1228–1235.

5. Faur, M., Jayne, D.T., Goradia, M., and Goradia, C., XPS investigation of anodic oxides grown on p-type InP, Surf. Interface Anal., 1990, vol. 15, no. 11, pp. 641–650.

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