Comparative X-ray Diffractometry of the Defect Structure of ZnO Epitaxial Films Deposited by Magnetron Sputtering on C-Plane Al2O3 Substrates in Inhomogeneous Electric Field-Reference-Cited by-同舟云学术

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Comparative X-ray Diffractometry of the Defect Structure of ZnO Epitaxial Films Deposited by Magnetron Sputtering on C-Plane Al2O3 Substrates in Inhomogeneous Electric Field

Published:2023-04 Issue:2 Volume:68 Page:195-202
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Volkovsky Yu. A.,Zhernova V. A.,Folomeshkin M. S.,Prosekov P. A.,Muslimov A. E.,Butashin A. V.,Ismailov A. M.,Grigoriev Yu. V.,Pisarevsky Yu. V.,Kanevsky V. M.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://link.springer.com/content/pdf/10.1134/S1063774523020219.pdf

Reference25 articles.

1. M. Izaki and T. Omi, Appl. Phys. Lett. 68 (17), 2439 (1996). https://doi.org/10.1063/1.116160

2. S. Kuznetsova, E. Mongush, and K. Lisitsa, J. Phys.: Conf. Ser. 1145 (1), 012020 (2019).

3. M. Laurenti and V. Cauda, Coatings 8 (2), 67 (2018). https://doi.org/10.3390/coatings8020067

4. G. J. Exarhos and S. K. Sharma, Thin Solid Films 270 (1–2), 27 (1995). https://doi.org/10.1016/0040-6090(95)06855-4

5. E. M. Bachari, G. Baud, S. B. Amor, et al., Thin Solid Films 348 (1–2), 165 (1999). https://doi.org/10.1016/s0040-6090(99)00060-7

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1. X-Ray- and Synchrotron-Radiation Study of the Defect Structure of Epitaxial ZnO Films Grown by Magnetron Deposition on Al2O3 and LaMgAl11O19 Substrates with (0001) Orientation;Nanobiotechnology Reports;2024-02

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