Author:
Chuev M. A.,Lomov A. A.,Imamov R. M.
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference31 articles.
1. A. M. Afanas’ev, P. A. Alexandrov, R. M. Imamov, et al., Acta Cristallogr. A 40, 352 (1984).
2. A. M. Afanas’ev, P. A. Alexandrov, R. M. Imamov, et al., Acta Cristallogr. A 41, 227 (1985).
3. A. M. Afanas’ev and S. S. Fanchenko, Dokl. Akad. Nauk SSSR 287, 1395 (1986) [Sov. Phys. Dokl. 31, 280 (1986)].
4. A. M. Afanas’ev, P. A. Aleksandrov, and R. M. Imamov, X-ray Diffraction Diagnostics of Submicron Layers (Nauka, Moscow, 1989) [in Russian].
5. V. S. Speriosi, M. A. Nicolet, J. L. Tandjn, et al., J. Appl. Phys. 57, 1377 (1985).
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