X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well-Reference-Cited by-同舟云学术

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X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well

Published:2017-05 Issue:3 Volume:62 Page:355-363
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Blagov A. E.,Galiev G. B.,Imamov R. M.,Klimov E. A.,Kondratev O. A.,Pisarevskii Yu. V.,Prosekov P. A.,Pushkarev S. S.,Seregin A. Yu.,Koval’chuk M. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774517030026.pdf

Reference31 articles.

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3. M. McElhinney, B. Vogele, M. C. Holland, et al., Appl. Phys. Lett. 68, 940 (1996).

4. R. D. Dupuis, P. D. Dapkus, R. D. Yingling, and L. A. Moudy, Appl. Phys. Lett. 31, 201 (1977).

5. M. Sexl, G. Bohm, D. Xu, et al., J. Cryst. Growth 175–176, 915 (1997).

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