X-ray diffractometry diagnosis of laser diffusion of aluminum into silicon-Reference-Cited by-同舟云学术

X-ray diffractometry diagnosis of laser diffusion of aluminum into silicon

Published:2000-05 Issue:5 Volume:45 Page:613-617
ISSN:1063-7842
Container-title:Technical Physics
language:en
Short-container-title:Tech. Phys.

Author:

Bushuev V. A.,Petrakov A. P.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/1.1259685.pdf

Reference20 articles.

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3. V. I. Fistul’ and A. M. Pavlov, Fiz. Tekh. Poluprovodn. (Leningrad) 17, 854 (1983) [Sov. Phys. Semicond. 17, 535 (1983)].

4. V. I. Fistul’, A. M. Pavlov, A. P. Ageev, and A. Sh. Aronov, Fiz. Tekh. Poluprovodn. (Leningrad) 20, 2140 (1986) [Sov. Phys. Semicond. 20, 1339 (1986)].

5. S. L. Antonov, A. A. Manenkov, G. N. Mikhailov, et al., Poverkhnost, No. 5, 151 (1991).

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