The use of capacitive charge division in silicon microstrip detectors-Reference-Cited by-同舟云学术

The use of capacitive charge division in silicon microstrip detectors

Published:2006-05 Issue:3 Volume:49 Page:318-330
ISSN:0020-4412
Container-title:Instruments and Experimental Techniques
language:en
Short-container-title:Instrum Exp Tech

Author:

Bashindzhagyan G. L.,Korotkova N. A.

Publisher

Pleiades Publishing Ltd

Subject

Instrumentation

Link

http://link.springer.com/content/pdf/10.1134/S0020441206030043.pdf

Reference15 articles.

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3. Hall, G., Vite, D., and Wheadon, R., Nucl. Instrum. Methods Phys. Res., Sect. A, 1993, vol. 326, p. 228.

4. Kötz, U., Pösnecker, K.U., Gatti, E., et al., Nucl. Instrum. Methods Phys. Res., Sect. A, 1985, vol. 235, p. 481.

5. Akimov, Yu.K., Ignat’ev, O.V., Kalinin, A.I., and Kushniruk, V.F., Poluprovodnikovye detektory v eksperimental’noi fizike (Semiconductor Detectors in Experimental Physics), Moscow: Energoatomizat, 1989.

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