Determining the position of an ionizing particle in a system of silicon microstrip detectors-Reference-Cited by-同舟云学术

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Determining the position of an ionizing particle in a system of silicon microstrip detectors

Published:2006-05 Issue:3 Volume:49 Page:331-341
ISSN:0020-4412
Container-title:Instruments and Experimental Techniques
language:en
Short-container-title:Instrum Exp Tech

Author:

Bashindzhagyan G. L.,Korotkova N. A.

Publisher

Pleiades Publishing Ltd

Subject

Instrumentation

Link

http://link.springer.com/content/pdf/10.1134/S0020441206030055.pdf

Reference5 articles.

1. Bashindzhagyan, G.L. and Korotkova, N.A., Prib. Tekh. Eksp., 2006, no. 3, p. 27 [Instrum. Exp. Tech. (Engl. Transl.), 2006, no. 3, p. 318].

2. Turchetta, R., Nucl. Instrum. Methods Phys. Res., Sect. A, 1993, vol. 335, p. 44.

3. Belau, E., Klanner, R., Lutz, G., et al., Nucl. Instrum. Methods Phys. Res., Sect. A, 1983, vol. 214, p. 253.

4. Chang, Y.-H., Chen, A.E., Hou, S.R., and Lin, W.T., Nucl. Instrum. Methods Phys. Res., Sect. A, 1995, vol. 363, p. 538.

5. Bashindzhagyan, G.L., Karmanov, D.E., Korotkova, N.A., and Merkin, M.M., Preprint of Institute of Nuclear Physics, Moscow State University, Moscow, 1999, no. 99-15/573.

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1. The use of capacitive charge division in silicon microstrip detectors;Instruments and Experimental Techniques;2006-05

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