Author:
Zaitsev S. V.,Kupreenko S. Yu.,Rau E. I.,Tatarintsev A. A.
Reference26 articles.
1. Reimer, L., Scanning Electron Microscopy, 2nd ed., Berlin: Springer-Verlag, 1998, p. 179.
2. Lin, P.S. and Becker, R.P., Scanning Electron Microscopy, O’Hare, Ed., Chicago: IITRI, 1975, p. 61.
3. Funsten, H., Suszcynsky, D., Ritzau, S., and Korde, R., IEEE Trans. Nucl. Sci., 1997, vol. 44, p. 2561.
4. Gostev, A.V., Ditsman, S.A., Zabrodskii, V.V., Luk’yanov, F.A., Rau, E.I., Sennov, R.A., and Sukhanov, V.L., Bull. Russ. Acad. Sci.: Phys. 2008, vol. 72, no. 11, pp. 1456–1461. DOI: 10.3103/S1062873808110026
5. Rau, E.I., Orlikovskii, N.A., and Ivanova, E.S., Semiconductors, 2012, vol. 46, no. 6, pp. 810–813. DOI: 10.1134/S1063782612060139
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