1. Berdermann, E., Pomorski, M., Boer, W., Ciobani, M., Dunst, S., Grah, C., Kiš, M., Koenig, W., Lange, W., Lohmann, W., Lovrincic, R., Moritz, P., Morse, J., Mueller, S., Pucci, A., et al., Diam. Relat. Mater., 2010, vol. 19, nos. 5-6, p. 358.
2. Altukhov, A.A., Anashin, V.S., Yemelyanov, V.V., Kozyukov, A.E., Kolyubin, V.A., Lvov, S.A., Nedosekin, P.G., and Sitnikov, M.G., Vopr. At. Nauki Tekhn. Ser.: Fiz. Radiat. Vozd. Radioelektr. Appar., 2013, no. 1, p. 85.
3. Kadilin, V.V., Kolyubin, V.A., Lvov, S.A., Nedosekin, P.G., Idalov, V.A., Tyurin, E.M., Kolesnikov, S.B., and Samosadnyi, V.T., Yader. Fizika Inzhinir., 2014, vol. 5, no. 2, p. 138.
4. Altukhov, A.A., Gerasimov, A.O., L’vov, S.A., Sitnikov, M.G., Feshchenko, V.S., Mityagin, A.N., and Muravyov, E.N., Pribory Sist.: Upravl., Kontr., Diagn., 2009, no. 12, p. 41.
5. Terentyev, N.I. and Kazakov, V.V., Instrum. Exp. Tech., 2014, vol. 57, no. 6, p. 662. doi 10.1134/S0020441214050182