Change in the Charge State of MOS Structures with a Radiation-Induced Charge under High-Field Injection of Electrons
Author:
Publisher
Pleiades Publishing Ltd
Subject
Surfaces, Coatings and Films
Link
https://link.springer.com/content/pdf/10.1134/S1027451023010056.pdf
Reference30 articles.
1. T. R. Oldham and F. B. McLean, IEEE Trans. Nucl. Sci. 50, 483 (2003). https://doi.org/10.1109/TNS.2003.812927
2. J. R. Schwank, M. R. Shaneyfelt, D. M. Fleetwood, J. A. Felix, P. E. Dodd, P. Paillet, and V. Ferlet-Cavrois, IEEE Trans. Nucl. Sci. 55, 1833 (2008). https://doi.org/10.1109/TNS.2008.2001040
3. D. M. Fleetwood, IEEE Trans. Nucl. Sci. 65, 1465 (2018). https://doi.org/10.1109/TNS.2017.2786140
4. H. L. Hughes and J. M. Benedetto, IEEE Trans. Nucl. Sci. 50, 500 (2003). https://doi.org/10.1109/TNS.2003.812928
5. I. S. Esqueda, H. J. Barnaby, and M. P. King, IEEE Trans. Nucl. Sci. 62, 1501 (2015). https://doi.org/10.1109/TNS.2015.2414426
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1. Technique of High-Field Electron Injection for Wafer-Level Testing of Gate Dielectrics of MIS Devices;Technologies;2024-07-04
2. Accumulation and Suppression of Radiation-Induced Charge in MOS Structures;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2024-04
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