On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM-Reference-Cited by-同舟云学术

On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM

Published:2018-01 Issue:1 Volume:12 Page:87-93
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Khoroshilov V. V.,Korchuganova O. A.,Lukyanchuk A. A.,Raznitsyn O. A.,Aleev A. A.,Rogozhkin S. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451017060106.pdf

Reference24 articles.

1. M. K. Miller, Atom Probe Tomography: Analysis at the Atomic Level (Kluwer Academic/Plenum Publ., New York, 2000).

2. J. Cairney, et al., Microsc. Microanal. 13 (2), 1634 (2007).

3. M. K. Miller, Microsc. Microanal. 11 (2), 808 (2005).

4. W. R. McKenzie, E. A. Marquis, and P. R. Munroe, in Microscopy: Science, Technology, Applications and Education (Formatex Research Center, Badajoz, 2010), p. 1800.

5. E. W. Z. Muller, Physik 131, 136 (1951).

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