Study of Silicon and the Transition Layer between Titanium and Titanium Oxide by Laser-Assisted Atom Probe Tomography-Reference-Cited by-同舟云学术

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Study of Silicon and the Transition Layer between Titanium and Titanium Oxide by Laser-Assisted Atom Probe Tomography

Published:2020-09 Issue:5 Volume:14 Page:882-888
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Raznitsyn O. A.,Lukyanchuk A. A.,Raznitsyna I. A.,Shutov A. S.,Khomich A. A.,Khoroshilov V. V.,Nikitin A. A.,Aleev A. A.,Rogozhkin S. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

https://link.springer.com/content/pdf/10.1134/S1027451020050158.pdf

Reference25 articles.

1. M. K. Miller and R. G. Forbes, Atom-Probe Tomography: The Local Electrode Atom Probe (Springer, London, 2014). https://doi.org/10.1007/978-1-4899-7430-3

2. P. Stender, C. Oberdorfer, M. Artmeier, P. Pelka, et al., Ultramicroscopy 107 (9), 726 (2007). https://doi.org/10.1016/j.ultramic.2007.02.032

3. S. V. Rogozhkin, N. A. Iskandarov, A. A. Lukyanchuk, A. S. Shutov, et al., Inorg. Mater.: Appl. Res. 9 (2), 231 (2018). https://doi.org/10.1134/S2075113318020247

4. S. V. Rogozhkin, A. A. Khomich, A. A. Nikitin, O. A. Raznitsyn, et al., Phys. At. Nucl. 81 (11), 1563 (2018). https://doi.org/10.1134/S1063778818120049

5. S. Kim, T. Y. Kim, K. H. Lee, T. H. Kim, et al., Nat. Commun. 8, 15891 (2017). https://doi.org/10.1038/ncomms15891

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