Author:
Andreev D. V.,Bondarenko G. G.,Stolyarov A. A.
Subject
Surfaces, Coatings and Films
Reference17 articles.
1. A. W. Strong, E. Y. Wu, R. Vollertsen, J. Suñé, G. L. Rosa, S. E. Rauch, and T. D. Sullivan, Reliability Wearout Mechanisms in Advanced CMOS Technologies (Wiley, Hoboken, 2009).
2. V. V. Andreev, G. G. Bondarenko, V. M. Maslovsky, A. A. Stolyarov, and D. V. Andreev, Phys. Status Solidi C 12, 126 (2015).
3. Y. K. Sharma, A. C. Ahyi, T. Issacs-Smith, X. Shen, S. T. Pantelides, X. Zhu, and L. C. Feldman, Solid-State Electron. 68, 103 (2012).
4. Y. K. Sharma, Yi. Xu, M. R. Jennings, C. Fisher, P. Mawby, L. C. Feldman, and J. R. Williams, Int. J. Fundam. Phys. Sci. 4 (2), 37 (2014).
5. P. Balk and J. M. Eldridge, Proc. IEEE 57, 1558 (1969).
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献