1. I. P. Herman, Optical Diagnostics for Thin Film Processing, Academic Press, New York (1996), 783 pp.
2. G. Bauer and W. Richter (Eds.), Optical Characterization of Epitaxial Semiconductor Layers, Springer-Verlag, Berlin (1996), 429 pp.
3. L. Mantese, U. Rossow, and D. E. Aspnes, Appl. Surf. Sci. 107, 35 (1996).
4. K. Uwai and N. Kobayashi, Appl. Surf. Sci. 107, 42 (1996).
5. L. Bleckmann, O. Hunderi, W. Richter, and E. Wold, Surf. Sci. 351, 277 (1996).