1. V. S. Pershenkov, V. D. Popov, and A. V. Shal’nov, Surface Radiation Effects in Integral Circuits (Énergoatomizdat, Moscow, 1988).
2. Ionizing Radiation Effects in MOS Devices and Circuits, Ed. by T. P. Ma and P. V. Dressendorfer (Wiley, New York, 1989).
3. E. N. Bormontov, M. N. Levin, S. N. Borisov, and S. A. Vyalykh, Zh. Tekh. Fiz. 71(2), 61 (2001) [Tech. Phys. 46, 192 (2001)].
4. R. J. van Overstraten, G. J. Declerck, and P. A. Muls, IEEE Trans. Electron Devices 22, 282 (1975).
5. P. J. McWhorter and P. S. Winokur, Appl. Phys. Lett. 48, 133 (1986).