Observation of antiphase domains in CdxHg1−x Te films on silicon by the phase contrast method in atomic force microscopy
Author:
Publisher
Pleiades Publishing Ltd
Subject
Physics and Astronomy (miscellaneous)
Link
http://link.springer.com/content/pdf/10.1134/1.2130915.pdf
Reference10 articles.
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4. I. V. Sabinina, A. K. Gutakovskii, Yu. G. Sidorov, and A. V. Latyshev, J. Cryst. Growth 274, 339 (2005).
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