Growth and characterization of CdTe/Si heterostructures — effect of substrate orientation-Reference-Cited by-同舟云学术

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Growth and characterization of CdTe/Si heterostructures — effect of substrate orientation

Published:2000-08 Issue:1 Volume:77 Page:93-100
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Smith David J,Tsen S.-C.Y,Chandrasekhar D,Crozier P.A,Rujirawat S,Brill G,Chen Y.P,Sporken R,Sivananthan S

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference21 articles.

1. Cadmium telluride thin films on silicon substrates

2. CdTe(111) growth on misoriented Si(100) substrates by hot-wall epitaxy

3. Physical properties of CdTe grown on Si by low pressure metalorganic chemical vapour deposition

4. Growth of CdTe films on silicon by molecular beam epitaxy

5. Molecular beam epitaxial growth of CdTe and HgCdTe on Si (100)

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1. Exploring the impact of defect energy levels in CdTe/Si dual-junction solar cells using wxAMPS;Scientific Reports;2024-02-27

2. 2D reciprocal space map of etched metalorganic chemical vapor deposited CdTe(001) film surface on miscut GaAs(001);Thin Solid Films;2023-05

3. Metalorganic Vapor Phase Epitaxy of Thick and Uniform Single Crystal CdTe Epitaxial Layers on (211) Si Substrates for X-ray Imaging Detector Development;Journal of Electronic Materials;2019-09-05

4. Characterization of Fine-Pixel X-Ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE;IEEE Transactions on Electron Devices;2019-01

5. Microstructural Characterization of Defects and Chemical Etching for HgCdSe/ZnTe/Si (211) Heterostructures;Journal of Electronic Materials;2018-10-30

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