Measurements of electrophysical characteristics of semiconductor structures with the use of microwave photonic crystals-Reference-Cited by-同舟云学术

Measurements of electrophysical characteristics of semiconductor structures with the use of microwave photonic crystals

Published:2016-12 Issue:13 Volume:50 Page:1759-1763
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Usanov D. A.,Nikitov S. A.,Skripal A. V.,Ponomarev D. V.,Latysheva E. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782616130091.pdf

Reference8 articles.

1. E. Yablonovitch, T. J. Gimitter, R. D. Meade, et al., Phys. Rev. Lett. 67, 3380 (1991).

2. B. A. Belyaev, A. S. Voloshin, and V. F. Shabanov, Dokl. Phys. 50, 337 (2005).

3. S. A. Nikitov, Yu. V. Gulyaev, D. A. Usanov, A. V. Skripal’, and D. V. Ponomarev, Dokl. Phys. 58, 6 (2013).

4. D. A. Usanov, A. V. Skripal, D. V. Ponomarev, et al., in Proceedings of the 44th European Microwave Conference, Rome, Italy, Oct. 6–9, 2014 (2014), p.984.

5. D. Usanov, A. Skripal, D. Ponomarev, et al., in Proceedings of the 20th International Conference on Microwaves, Radar, and Wireless Communications MIKON-2014, Gdansk, Poland, June 16–18, 2014 (2014), Vol. 1, p.62.

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