Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals-Reference-Cited by-同舟云学术

Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals

Published:2013-01 Issue:1 Volume:58 Page:6-8
ISSN:1028-3358
Container-title:Doklady Physics
language:en
Short-container-title:Dokl. Phys.

Author:

Nikitov S. A.,Gulyaev Yu. V.,Usanov D. A.,Skripal’ A. V.,Ponomarev D. V.

Publisher

Pleiades Publishing Ltd

Subject

General Physics and Astronomy,Mechanics of Materials,Computational Mechanics

Link

http://link.springer.com/content/pdf/10.1134/S1028335813010023.pdf

Reference4 articles.

1. E. M. Gershenzon, L. B. Litvak-Gorskaya, L. A. Plokhova, and T. S. Zarubina, in Semiconductor Devices and Their Application (Moscow, 1970), no. 23, 3 [in Russian].

2. M. N. Asfar, J. R. Birch, and R. N. Clarke, Proc. IEEE 74(1), 183 (1986).

3. D. A. Usanov, A. E. Postel’ga, and N. Yu. Sysoev, Izv. Vuzov. Elektronika 90, 71 (2011).

4. Yu. V. Gulyaev, S. A. Nikitov, D. A. Usanov, et al., Dokl. Akad. Nauk 443(5), 564 (2012).

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