1. Aristov, V.V., Dremova, N.N., and Rau, E.I., Characteristics, Features, and Examples of Use of the Toroidal Energy Analyzer in Scanning Electron Microscopy, Zh. Tech. Phys., 1996, vol. 66, no. 10, pp. 78–86.
2. Niedrig, H. and Rau, E.I., Information depth and spatial resolution of BSE microtomography in SEM, Nucl. Instr. Methods Phys. Res. B, 1998, vol. 142, no. 4, pp. 523–534.
3. Gostev, A.V., Matvienko, A.N., Rau, E.I., Savin, V.O., and Savin, D.O., On the Information Depth of the Backscattered Electrons Mode of Operation in SEM, Izv. Ross. Acad. Nauk. Ser. Fiz., 1998, vol. 62, no. 3, pp. 591–598.
4. Gostev, A.V., Zhukov, A.N., Moll, Sh.Kh., Rau., E.I., and Yakimov, E.B., Analysis of Information Obtained by the Electron-Induced Potential Method in SEM, Izv. Ross. Acad. Nauk. Ser. Fiz., 1998, vol. 62, no. 3, pp. 599–605.
5. Rau, E.I., Gostev, A.V., Zhu Shiqiu, Phang, D., Chan, D., Thong, D., and Wong, W., Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Voltage Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic Detection, Microelectron., 2001, vol. 30, no. 4, pp. 243–246 [Russ. Microelectron. (Engl. Transl.), vol. 30, no. 4, pp. 207–218].