Subject
Instrumentation,Nuclear and High Energy Physics
Reference20 articles.
1. H. Seiler, Scanning Electron Microscopy, vol. I (1976) 9
2. O. Wells, R. Savoy, P. Bailey, in: D.F. Kyser, H. Niedrig, D.E. Newbury, R. Shimizu (Eds.), Electron Beam Interaction with Solids, SEM Inc. AMF O'Hare, Chicago, 1982, p. 287
3. Detector strategy for secondary and backscattered electrons using multiple detector systems
4. A study of BSE signals of double layers on substrates at various detector take-off angles
5. Effects of collector take-off angle and energy filtering on the BSE image in the SEM
Cited by
45 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献