Raising the Accuracy of Monitoring the Optical Coating Deposition by Application of a Nonlocal Algorithm of Data Analysis

Author:

Kochikov I. V.,Lagutin Iu. S.,Lagutina A. A.,Lukyanenko D. V.,Tikhonravov A. V.,Yagola A. G.

Publisher

Pleiades Publishing Ltd

Subject

Applied Mathematics,Industrial and Manufacturing Engineering

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Algorithm for Monitoring Optical Coating Sputter Deposition Based on Broadband Measurement Sample Data;Journal of Applied and Industrial Mathematics;2023-09

2. Visual Intelligent Recognition System Based on Visual Thinking;Proceedings of the 4th International Conference on Big Data Analytics for Cyber-Physical System in Smart City - Volume 1;2023

3. Design of English Translation Intelligent Recognition System Based on Data Analysis Algorithm;2022 European Conference on Natural Language Processing and Information Retrieval (ECNLPIR);2022-07

4. Impact of ion species on ion beam sputtered Ta2O5 layer quality parameters and on corresponding process productivity: A preinvestigation for large-area coatings;Journal of Vacuum Science & Technology A;2021-12

5. Comparative Analysis of Algorithms for Solving Inverse Problems Related to Monochromatic Monitoring the Deposition of Multilayer Optical Coatings;Computational Mathematics and Mathematical Physics;2021-09

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