Electron Microscopy Study of a Chalcogenide-Based Polycrystalline Condensate Microstructure: The Effect of Composition and Thickness on Internal Lattice Bending-Reference-Cited by-同舟云学术

Electron Microscopy Study of a Chalcogenide-Based Polycrystalline Condensate Microstructure: The Effect of Composition and Thickness on Internal Lattice Bending

Published:2005 Issue:8 Volume:39 Page:955
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Kolosov V. Yu.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/1.2010692.pdf

Reference12 articles.

1. V. Yu. Kolosov, Candidate’s Dissertation (Inst. of Metal Physics, Ural Division, USSR Academy of Sciences, Sverdlovsk, 1982).

2. I. E. Bolotov, V. Yu. Kolosov, and A. V. Kozhin, Phys. Status Solidi A 72, 645 (1982).

3. V. Yu. Kolosov and A. R. Tholen, Acta Mater. 48, 1829 (2000).

4. V. Yu. Kolosov, Abstracts of 7th All-Union Conference on Crystal Growth (Inst. Kristallogr. Akad. Nauk SSSR, Moscow, 1988), Vol. 1, p. 13.

5. V. Yu. Kolosov, L. M. Veretennikov, A. A. Kuzmin, and V. A. Mamaev, in Proceedings of ICEM-13 (Paris, 1994), Vol. 2A, p. 397.

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