Multi-gate BCAT Structure and Select Word-line Driver in DRAM for Reduction of GIDL
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Published:2022-12-31
Issue:6
Volume:22
Page:452-458
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ISSN:1598-1657
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Container-title:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
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language:en
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Short-container-title:JSTS
Author:
Lim Chang-Young,Kwon Min-Woo
Publisher
The Institute of Electronics Engineers of Korea
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials