A curved vacuum deposited thin film sample holder for Seemann-Bohlin diffractometer

Abstract

Abstract A sample holder is designed and constructed for the Seemann-Bohlin diffractometer obtained by converting a Siemens horizontal X-ray diffractometer with the help of a mechanical linkage. This sample holder allows one to use a vacuum deposited thin film sample, curved to a radius of curvature equal to that of the diffraction circle. It is found that using a curved sample instead of a flat one increases the peak intensity by about 20% and reduces the profile broadening, measured at half its maximum intensity, from (0.85 ± 0.10)° 40 for the sample to (0.50 ± 0.10)° 40 for the curved sample.