Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction-Reference-Cited by-同舟云学术

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Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction

Published:2008-02 Issue:27 Volume:2008 Page:263-271
ISSN:0930-486X
Container-title:Zeitschrift für Kristallographie Supplements
language:en
Short-container-title:Z. Kristallogr. Suppl.

Author:

Birkholz M.,Darowski N.,Zizak I.

Publisher

Walter de Gruyter GmbH

Subject

Inorganic Chemistry,Condensed Matter Physics,General Materials Science

Reference34 articles.

1. Influence of apparatus geometry and deposition conditions on the structure and topography of thick sputtered coatings

2. Texture and anisotropy

3. Investigation of Inhomogeneous Surface Textures With Constant Information Depth: Part 1: Fundamentals

4. X-ray texture tomography of near-surface areas

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1. Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping;Ultramicroscopy;2015-12

2. Depth-dependent evolution of texture and stress in thin films;Acta Crystallographica Section A Foundations and Advances;2015-08-23

3. Estimating the In-Plane Young's Modulus of Polycrystalline Films in MEMS;Journal of Microelectromechanical Systems;2012-08

4. Through-thickness texture profiling by energy dispersive synchrotron diffraction;Journal of Applied Crystallography;2010-10-13

5. A thin film approach to protein crystallography;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-02

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