1. S. Valyukh, J. Osterman, and K. Skarp, “A simple spectroscopic method to measure cell gap and twist angle of TN LCD,”Proc 23rd IDRC, 199–202 (2003).
2. S. Valyukh, I. Valyukh, C. Adas, V. Chigrinov, and K. Skarp, “Reflective liquid crystal cell parameters measurement Asia Display,”Proc IMID '04, 479–482 (2004).
3. Measurement of reflective liquid crystal displays
4. S. T. Tang and H. S. Kwok, “Measurement of reflective LCD cell gap,”Proc IDW '00, 109–111 (2000).
5. The performance and reliability of PMOSFET's with ultrathin silicon nitride/oxide stacked gate dielectrics with nitrided Si-SiO/sub 2/ interfaces prepared by remote plasma enhanced CVD and post-deposition rapid thermal annealing