70.4: A 14.1inch AMOLED Display using Highly Stable PECVD based Microcrystalline Silicon TFT Backplane-Reference-Cited by-同舟云学术

70.4: A 14.1inch AMOLED Display using Highly Stable PECVD based Microcrystalline Silicon TFT Backplane

Published:2006 Issue:1 Volume:37 Page:1972
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest

Author:

Girotra Kunal S.,Souk JunHyung,Chung Kyuha,Lim Soonkwon,Kim Shiyul,Kim Byoung-June,Yang Sung-Hoon,Choi Beohmrock,Goh Joonchul,Song Young-Rok,Choi Yong-Mo

Publisher

Wiley

Reference9 articles.

1. J. J. Lih, C. F. Sung, C. H. Li, T. H. Hsiao, H. H. Lee. “Comparison of a-Si and poly-Si for AMOLEDs” Society for Information Display 2004, p. 1504

2. P. Roca i Cabarrocas, S. Kasouit, B. Kalache, R. Vanderhaghen, Y. Bonnassieux, M. Elyaakoubi, I. French. “Microcrystalline silicon: An emerging material for stable thin film transistors” Society of Information Display 2003, Volume 34, Issue 1, pp. 1096

3. Investigation of grain boundary control in the drain junction on laser-crystalized poly-Si thin film transistors

4. I. C Cheng, S. Wagner, “Nanocrystalline silicon thin film transistors” IEEE Proc-Circuits Devices Syst., Vol. 150, No. 4, August 2003

5. High-mobility nanocrystalline silicon thin-film transistors fabricated by plasma-enhanced chemical vapor deposition

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