Evaluation of the van der Waals force for atomic force microscopy
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.72.033410/fulltext
Reference11 articles.
1. Atomic-Resolution Dynamic Force Microscopy and Spectroscopy of a Single-Walled Carbon Nanotube: Characterization of Interatomic van der Waals Forces
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