Atomic-Resolution Dynamic Force Microscopy and Spectroscopy of a Single-Walled Carbon Nanotube: Characterization of Interatomic van der Waals Forces
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.93.136101/fulltext
Reference24 articles.
1. Noncontact Atomic Force Microscopy
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
3. Dynamic Force Spectroscopy of Conservative and Dissipative Forces in an Al-Au(111) Tip-Sample System
4. Interpretation of “true atomic resolution” images of graphite (0001) in noncontact atomic force microscopy
5. Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy
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