Temperature dependence of noise processes in metals
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.34.723/fulltext
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1. Hall effect, anisotropy, and temperature-dependence measurements of1fnoise in silicon on sapphire
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3. Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency (1f?) Noise
4. 1fγnoise in thick-film resistors as an effect of tunnel and thermally activated emissions, from measures versus frequency and temperature
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