MonitoringB-site ordering and strain relaxation in NiFe2O4epitaxial films by polarized Raman spectroscopy-Reference-Cited by-同舟云学术

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MonitoringB-site ordering and strain relaxation in NiFe2O4epitaxial films by polarized Raman spectroscopy

Published:2011-01-24 Issue:1 Volume:83 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Iliev M. N.,Mazumdar D.,Ma J. X.,Gupta A.,Rigato F.,Fontcuberta J.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.83.014108/fulltext

Reference18 articles.

1. Thin-film ferrites for microwave and millimeter-wave applications

2. Enhancement in magnetoelectric response in CoFe2O4–BaTiO3 heterostructure

3. NiFe2O4: A Versatile Spinel Material Brings New Opportunities for Spintronics

4. Effect of growth temperature on the magnetic, microwave, and cation inversion properties on NiFe2O4 thin films deposited by pulsed laser ablation deposition

5. Enhanced magnetic moment and conductive behavior inNiFe2O4spinel ultrathin films

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