ICEMS Characterization of NixFe3-xO4 (0.7 ≤ x ≤ 1.7) thin films grown by ion beam sputtering on (0001) Al2O3 substrates

Abstract

AbstractWe report here on the ICEMS characterization of nickel ferrite (NixFe3−xO4) thin films having different nickel contents grown on alumina substrates by Ion Beam Sputtering. The spectra corresponding to the films with nominal x = 0.7, 1.0 and 1.2 are characteristic of compounds crystallizing in a spinel-related structure showing two different magnetic sextets associated with Fe3+ located in the tetrahedral and octahedral sites of such structure. The spectra show an additional broad third sextet with a large isomer shift which suggests the occurrence of electron hopping between Fe2+ and Fe3+ ions sitting in the octahedral sites. With increasing nickel content, the linewidth of the sextets increases and their corresponding hyperfine magnetic fields decrease. This is an indication of an increase in structural disorder in the deposited films as their nickel concentrations increase. The cation distribution of the iron ions over the tetrahedral and octahedral sites appears also to depend on the nickel content. The film with x = 1.2 shows a significant increase in the fraction of octahedral iron ions as compared with the expected nominal value suggesting that, for this composition, some Ni2+ could also occupy tetrahedral sites. The Mössbauer spectrum corresponding to the film with x = 1.7 shows a magnetic pattern with very broad lines similar to those shown by amorphous or disordered materials. The average isomer shift is quite high (around 0.40 mms− 1) and characteristic of Fe3+ in octahedral oxygen coordination. This indicates that for the largest nickel content studied (x = 1.7), the film does not contain Fe3+ in tetrahedral environments suggesting that the spinel structure is no longer present. This correlates well with the X-Ray Diffraction data which indicate a structural change from spinel to a disordered rock-salt structure for this particular film with high nickel content.