X-ray reflectivity and diffuse-scattering study ofCoSi2layers in Si produced by ion-beam synthesis
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.47.4385/fulltext
Reference16 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. X-ray and neutron scattering from rough surfaces
3. Neutron scattering by rough surfaces at grazing incidence
4. Diffuse scattering of hard x rays from rough surfaces
5. Mesotaxy: Single‐crystal growth of buried CoSi2layers
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