Simulation of ellipsometric spectra from nanocrystalline silicon floating gate structures
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.67.155326/fulltext
Reference40 articles.
1. Ab InitioAbsorption Spectra and Optical Gaps in Nanocrystalline Silicon
2. Evidence of quantum size effect in nanocrystalline silicon by optical absorption
3. Refractive index and degree of inhomogeneity of nanocrystalline TiO[sub 2] thin films: Effects of substrate and annealing temperature
4. Spectroscopic ellipsometry of composite thin films with embedded Bi nanocrystals
5. Dielectric function of V2O5 nanocrystalline films by spectroscopic ellipsometry: Characterization of microstructure
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Evidence of quantum confinement effects on interband optical transitions in Si nanocrystals;Physical Review B;2010-07-01
2. Size-dependent interface band alignment between Si nanocrystals and lattice-matched Gd2O3;Applied Physics Letters;2009-09-07
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