Dielectric function of V2O5 nanocrystalline films by spectroscopic ellipsometry: Characterization of microstructure
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1289658
Reference11 articles.
1. Electrochromic vanadium–pentoxide–based films: Structural, electrochemical, and optical properties
2. Memory switching of V2O5TeO2 glasses
3. Influence of oxygen partial pressure on the optical properties of electron beam evaporated vanadium pentoxide thin films
4. Optical and electrical properties of V2O5 thin films
5. Effect of thickness on the optical absorption edge of sputtered vanadium oxide films
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