Time-resolved hole transport ina−SiO2
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.15.2012/fulltext
Reference30 articles.
1. Vacuum Ultraviolet Radiation Effects in SiO2
2. Hole and electron transport in SiO2 films
3. Hole mobility and transport in thin SiO2 films
4. Role Transport and Charge Relaxation in Irradiated SiO2 MOS Capacitors
5. Hole Transport and Recovery Characteristics of SiO2 Gate Insulators
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