Electronic structure and properties ofNiSi2andCoSi2in the fluorite and adamantane structures
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.36.2493/fulltext
Reference32 articles.
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3. Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures
4. Diffusion-layer microstructure of Ni on Si(100)
5. Diffusion layers and the Schottky-barrier height in nickel silicide—silicon interfaces
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